Technical Description

Our Field Emission Scanning Electron Microscope is equipped with an Oxford Instruments UltimMax 170 Energy Dispersive X-ray (EDX) detector for precise elemental analysis, and an Oxford Instruments Symmetry S3 Electron Backscattered Diffraction (EBSD) detector to comprehensively evaluate grain microstructure and orientation.

The FE-SEM facilitates high-resolution imaging across a range of magnifications, enabling detailed examination of materials ranging from 10 nanometres to several millimetres. Multiple electron detectors are integrated into the system to optimise imaging clarity, allowing for detailed observations of surface morphology, fine textures, and compositional variations in diverse materials such as ceramics, metals, polymers, and pharmaceuticals.

Uses and Applications

Our advanced FE-SEM is employed across a multitude of industries, including aerospace, automotive, pharmaceuticals, ceramics, electronics, and medical devices. Typical applications include:

• Analysis of raw material powders, evaluating particle size, shape, and surface morphology
• Inspection of surface textures on machined or 'as manufactured' components
• Characterisation of material microstructure, including identification of phases, porosity, and inclusions through advanced EDX elemental mapping
• Assessment of grain size and orientation in ceramics and metal alloys via EBSD
• Detection and characterisation of contaminants in pharmaceuticals, ceramics, refractories, and filtration residues
• Validation studies such as particle shedding assessments from medical implants

Benefits of Using Our FE-SEM

Using our Hitachi SU7000 FE-SEM provides numerous advantages:

• Enhanced Imaging Resolution: Offers exceptional clarity to visualise extremely small features down to nanometre scale, facilitating precise analytical results
• Comprehensive Analytical Capability: Combines powerful EDX and EBSD techniques, enabling simultaneous elemental composition analysis and grain structure mapping
• Versatile Material Compatibility: Applicable to a broad spectrum of materials, expanding analytical possibilities for research and quality assurance
• High-Quality and Reliable Data: Provides detailed and accurate data, ensuring consistent quality assurance and advanced materials research outcomes
• Expert Technical Support: Operated by our experienced technical specialists, ensuring optimal performance and accurate, reliable analytical results

Choosing our Field Emission Scanning Electron Microscope services empowers your research and development initiatives, ensuring innovation, reliability, and superior quality in your material analysis and characterisation projects.

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